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Consejo Superior de Investigaciones Científicas Instituto de Microelectrónica de Barcelona Centro Nacional de Microelectrónica pH-ISFET CHARACTERISTICS General Substrate p-type 4-inch silicon wafers Chip dimensions 3 x 3 mm Gate length 10 μm Gate width ≥ 500 μm Gate structure Silicon oxide / Silicon nitride (Standard) Electrical Specifications Operational drain voltage, Vd 0.5 - 2.0 V Operational drain current, Id 0.1 - 1.0 mA Transconductance, Gm > 0.5 mA / V Threshold voltage, Vth -2.0 – 1.0 V at pH 7 versus Ag/AgCl reference electrode Leakage current, Il < 10 nA Chemical Specifications Sensitivity, S ≥ 55 mV / pH Linear range 1 - 13 pH Accuracy 0.05 pH Selectivity coefficients < 10-5 to alkaline metal ions Long term drift ≤ 1.0 mV/h (after preconditioning) Lifetime > 8 months in continuous immersion at pH=7 Standard parameters for silicon nitride gate dielectric. Consejo Superior de Investigaciones Científicas Instituto de Microelectrónica de Barcelona Centro Nacional de Microelectrónica 0.3 1233-12-138 0.2 1233-12-140 0.1 1233-12-139 600 560 0 Potential (mV) 1233-12-141 -0.1 -0.2 -0.3 -0.4 520 480 440 400 -0.5 360 -0.6 0 0 2 4 6 8 10 12 100 200 300 500 600 700 800 Time (min) Figure 1. Calibration plots for several Si3N4 pH-ISFET (slope average: 56.8 ±0.1 mV 7pH) Figure 2. Study of pH-ISFET stability for pH 4 and 7 jumps. 100 90 80 70 60 50 40 30 20 10 0 -1.5 400 14 pH Id (uA) Vout, V 0.4 -1 -0.5 0 0.5 1 Vg (V) Figure 3.Current-voltage characteristics of a pHISFET measured at VD :0.5 V during 8 months immersed in aqueous solution. 1.5 900 1000
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